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Thermal diffusivity measurements - made easy

LFA 447 NanoFlash® - Xenon Flash Apparatus

 

 

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Determination of thermophysical properties is quick, easy and cost-effective with the new LFA 447 NanoFlash® Light Flash System.

A high-performance Xenon flash lamp takes the place of the laser, which is usually employed for this proven technique.

With the integrated sample changer for 4 samples, it is possible to run measurements on several samples automatically. The easily-accessible sample carrier allows short setting periods for test preparation and a high through-put of samples.

Unique is the optional scanning device (MTX) for flat samples up to 50 mm x 50 mm for determining differences in the thermal diffusivity over the entire sample surface with a spatial resolution of 100 µm in the x and y directions.


NETZSCH offers instruments for thermal analysis, thermal properties measurement, thermal hazard screening, and contract testing services. Our portfolio is the world's broadest, including a full range of dilatometers to measure high accuracy thermal expansion, classical DSC & TGA, high temperature DSC to 1650°C for specific heat, very high temperature STA (TGA-DSC/DTA) from sub-ambient to 2400°, thermal / evolved gas analysis with fully-integrated FTIR & MS, high resolution TMA and DMA, plus DEA - dielectric analysis for thermoset cure monitoring. We also feature leading-edge technology for thermal conductivity by guarded hot plate and heat flow meters, laser flash thermal diffusivity measurement, thermal hazard screening via adiabatic reaction calorimetry, as well as refractories testing including HMOR, CIC, and RUL. Finally, we offer advanced software packages including thermokinetics for process modeling and development.

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Last update: 04/22/2009 , Copyright © 2000-2006 NETZSCH-Geraetebau GmbH